期刊論文
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H. Yeh and D. M. Tsai, 2001, “A Rotation-Invariant and Non-Referential Approach for BallGrid Array (BGA) Substrate Conducting Path Inspection”, International Journal of Advanced Manufacturing Technology , 17, pp. 412-424. (SCI, EI) (NSC 89-2213-E-155-006)
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C. H. Yeh and D. M. Tsai, 2001, “Wavelet-based Approach for Ball Grid Array (BGA) Substrate Conduct Paths Inspection”, International Journal of Production Research , 39(18), pp. 4281-4299. (SCI, EI) (NSC 89-2213-E-155-006)
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C. H. Yeh, 2002, “Ball Grid Array (BGA) Substrate Conduct Paths Inspection Using Two-Dimensional Wavelet Transform”, International Journal of Production Research , 40(18 ), pp. 4675-4695. (SCI, EI) (NSC-90-2218-E-027-019)
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C. H. Yeh, 2003, “Wavelet-based corner detection using eigenvectors of covariance matrices”, Pattern Recognition Letters , 24(15), pp.2797-2806. (SCI)
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C. H. Yeh, F. C. Tien, and F. C. Wu, 2003, “A Boundary-based Passive Component Inspection Approach Using Eigenvalues of Covariance Matrices”, International Journal of Production Research , 41(17), pp. 4025-4040. (SCI , EI)
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C. H. Yeh, 2003, “A Novel Approach Using Two-Dimension Wavelet Transform In Ball Grid Array (BGA) Substrate Conduct Paths Inspection”, International Journal of Advanced Manufacturing Technology, 3, pp. 223-233. (SCI, EI) , (NSC-90-2218-E-027-019)
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C. H. Yeh, T. C. Shen, and F. C. Wu, 2003, “A Case Study: Passive Component Inspection Using 1-D Wavelet Transform”, International Journal of Advanced Manufacturing Technology , 22, pp. 899-910. (SCI, EI) (NSC-91-2213-E-027-018)
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F. C. Tien , C. H. Yeh , and Kuang-Han Hiesh, 2004 , “ Automated visual inspection for microdrills in printed circuit board (PCB) production”, International Journal of Production Research , 42(12), pp. 2477-2495. (SCI, EI)
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F. C. Wu and C. H. Yeh, 2004, (online first) “Robust Design of Multiple Dynamic Quality Characteristics”, International Journal of Advanced Manufacturing Technology . (SCI, EI)
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C. H. Yeh, F. C. Wu, and F. C. Tien, 2004, (submitted for reviewing) “Validation for defect-kill-rate and yield models in semiconductor manufacturing”, IEEE Design & Test of computers. (SCI)
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C. H. Yeh, F. C. Wu, and W. L. Chi, 2005, (submitted for reviewing) “ A wavelet-based approach in detecting visual defects on wafer dies”, Machine vision and applications. (SCI)
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研討會論文
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葉 繼豪 , 1998, ”Inspecting Ball Grid Array (BGA) by 2-D Image Analysis Algorithm and 3-D Laser Scanner”, 工業工程 87 年度年會 , pp. 1176-1179.
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C. H. Yeh and D. M. Tsai, 1999, “Machine Vision Inspection for Ball Grid Array (BGA) Substrate Conduct paths”, 工業工程 88 年度年會.
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C. H. Yeh and B. C. Ou Yang, 1999, “Detecting the Boundary Defects on Ball Grid Array (BGA) Substrate Conduct Paths by Using Covariance Matrices”, 第十五屆全國技職與教育研討會.
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C. H. Yeh and D. M. Tsai, 2000, “Ball Grid Array (BGA) Substrate Inspection by 1-D Wavelet Transform”, Proceedings of the 5 th annual International Conference on Industrial Engineering – Theory, Applications and Practice.
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C. H. Yeh and D. M. Tsai, 2001, “Ball Grid Array (BGA) Substrate Inspection by Using 1-D Wavelet Transform”, 第十四屆電腦視覺圖學與影像處理研討會 (CVGIP2001).
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C. H. Yeh, F. C. Wu, and M. J. Wang, 2001, “The Application of Two-Dimension Wavelet Transform In Ball Grid Array (BGA) Substrate Conduct Path Inspection”, Proceedings of the 6 th annual International Conference on Industrial Engineering – Theory, Applications and Practice.
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C. H. Yeh, 2002, “2-D Wavelet Transform Approach in Ball Grid Array (BGA) Substrate Conduct Paths Inspection”, Proceedings of 2002 Printed Circuit Board (PCB) Manufacturing and Management Technique Conference, Yuan-Ze University .
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F. C. Wu and C. H. Yeh, 2002, “Taguchi's Optimal Tolerance Design”, The 7 th Annual International Conference on Industrial Engineering-Theory, Application and Practice.
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葉繼豪 , 鄭光量 , 2002 “ 產品資料管理系統導入之績效評估 ”, 2002 年科技與管理學術研討會 , 台北科技大學.
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F. C. Wu, C. C. Chyu and C. H. Yeh, “Optimization of Robust Design for Multiple Quality Characteristics”, The 7th Annual International Conference on Industrial Engineering-Theory, Application and Practice.
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C. H. Yeh, S. Y. Wei, and F. C. Wu, 2002, “Passive Component Inspection Using the Eigenvalue of Covariance Matrix”, 2002 APIEM, Proceedings of the 4 th Asia-Pacific Conference on Industrial Engineering and Management system.
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C. H. Yeh, R. L. Lai, and F. C. Wu, "A Novel Approach For Inspecting Multi-layer Ceramic Capacitors (MLCC) by 1-D Wavelet Transform ",Proceedings of IE&EM'2003, 2003 International Conference of Industrial Engineering and Engineering Management: Global Industrial Engineering in e-century.
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