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葉繼豪

◇ 相關資料 ◇

姓名
葉繼豪
職稱
教授
最高學歷
元智大學 工業工程與管理博士
研究領域
研發管理、研發介面與流程技法、工程創新與管理創新構思問題解決(TRIZ)、專案管理、自動光學檢測(AOI)、TRIZ與DFMA整合、TRIZ綠色設計與產品演劃趨勢、產品知識管理與專利搜尋、產品穩建設計、生產管理...
研究室
科技大樓 1027
聯絡電話
(02)2771-2171ext.2336
E-Mail
網站

產品研發管理與萃思創新設計研究室


期刊論文
1.
H. Yeh and D. M. Tsai, 2001, “A Rotation-Invariant and Non-Referential Approach for BallGrid Array (BGA) Substrate Conducting Path Inspection”, International Journal of Advanced Manufacturing Technology , 17, pp. 412-424. (SCI, EI) (NSC 89-2213-E-155-006)
2.
C. H. Yeh and D. M. Tsai, 2001, “Wavelet-based Approach for Ball Grid Array (BGA) Substrate Conduct Paths Inspection”, International Journal of Production Research , 39(18), pp. 4281-4299. (SCI, EI) (NSC 89-2213-E-155-006)
3.

C. H. Yeh, 2002, “Ball Grid Array (BGA) Substrate Conduct Paths Inspection Using Two-Dimensional Wavelet Transform”, International Journal of Production Research , 40(18 ), pp. 4675-4695. (SCI, EI) (NSC-90-2218-E-027-019)

4.
C. H. Yeh, 2003, “Wavelet-based corner detection using eigenvectors of covariance matrices”, Pattern Recognition Letters , 24(15), pp.2797-2806. (SCI)
5.
C. H. Yeh, F. C. Tien, and F. C. Wu, 2003, “A Boundary-based Passive Component Inspection Approach Using Eigenvalues of Covariance Matrices”, International Journal of Production Research , 41(17), pp. 4025-4040. (SCI , EI)
6.
C. H. Yeh, 2003, “A Novel Approach Using Two-Dimension Wavelet Transform In Ball Grid Array (BGA) Substrate Conduct Paths Inspection”, International Journal of Advanced Manufacturing Technology, 3, pp. 223-233. (SCI, EI) , (NSC-90-2218-E-027-019)
7.
C. H. Yeh, T. C. Shen, and F. C. Wu, 2003, “A Case Study: Passive Component Inspection Using 1-D Wavelet Transform”, International Journal of Advanced Manufacturing Technology , 22, pp. 899-910. (SCI, EI) (NSC-91-2213-E-027-018)
8.
F. C. Tien , C. H. Yeh , and Kuang-Han Hiesh, 2004 , “ Automated visual inspection for microdrills in printed circuit board (PCB) production”, International Journal of Production Research , 42(12), pp. 2477-2495. (SCI, EI)
9.
F. C. Wu and C. H. Yeh, 2004, (online first) “Robust Design of Multiple Dynamic Quality Characteristics”, International Journal of Advanced Manufacturing Technology . (SCI, EI)
10.
C. H. Yeh, F. C. Wu, and F. C. Tien, 2004, (submitted for reviewing) “Validation for defect-kill-rate and yield models in semiconductor manufacturing”, IEEE Design & Test of computers. (SCI)
11.
C. H. Yeh, F. C. Wu, and W. L. Chi, 2005, (submitted for reviewing) “ A wavelet-based approach in detecting visual defects on wafer dies”, Machine vision and applications. (SCI)

研討會論文
1.
葉 繼豪 , 1998, ”Inspecting Ball Grid Array (BGA) by 2-D Image Analysis Algorithm and 3-D Laser Scanner”, 工業工程 87 年度年會 , pp. 1176-1179.
2.
C. H. Yeh and D. M. Tsai, 1999, “Machine Vision Inspection for Ball Grid Array (BGA) Substrate Conduct paths”, 工業工程 88 年度年會.
3.
C. H. Yeh and B. C. Ou Yang, 1999, “Detecting the Boundary Defects on Ball Grid Array (BGA) Substrate Conduct Paths by Using Covariance Matrices”, 第十五屆全國技職與教育研討會.
4.
C. H. Yeh and D. M. Tsai, 2000, “Ball Grid Array (BGA) Substrate Inspection by 1-D Wavelet Transform”, Proceedings of the 5 th annual International Conference on Industrial Engineering – Theory, Applications and Practice.
5.
C. H. Yeh and D. M. Tsai, 2001, “Ball Grid Array (BGA) Substrate Inspection by Using 1-D Wavelet Transform”, 第十四屆電腦視覺圖學與影像處理研討會 (CVGIP2001).
6.
C. H. Yeh, F. C. Wu, and M. J. Wang, 2001, “The Application of Two-Dimension Wavelet Transform In Ball Grid Array (BGA) Substrate Conduct Path Inspection”, Proceedings of the 6 th annual International Conference on Industrial Engineering – Theory, Applications and Practice.
7.
C. H. Yeh, 2002, “2-D Wavelet Transform Approach in Ball Grid Array (BGA) Substrate Conduct Paths Inspection”, Proceedings of 2002 Printed Circuit Board (PCB) Manufacturing and Management Technique Conference, Yuan-Ze University .
8.
F. C. Wu and C. H. Yeh, 2002, “Taguchi's Optimal Tolerance Design”, The 7 th Annual International Conference on Industrial Engineering-Theory, Application and Practice.
9.
葉繼豪 , 鄭光量 , 2002 “ 產品資料管理系統導入之績效評估 ”, 2002 年科技與管理學術研討會 , 台北科技大學.
10.
F. C. Wu, C. C. Chyu and C. H. Yeh, “Optimization of Robust Design for Multiple Quality Characteristics”, The 7th Annual International Conference on Industrial Engineering-Theory, Application and Practice.
11.
C. H. Yeh, S. Y. Wei, and F. C. Wu, 2002, “Passive Component Inspection Using the Eigenvalue of Covariance Matrix”, 2002 APIEM, Proceedings of the 4 th Asia-Pacific Conference on Industrial Engineering and Management system.
12.
C. H. Yeh, R. L. Lai, and F. C. Wu, "A Novel Approach For Inspecting Multi-layer Ceramic Capacitors (MLCC) by 1-D Wavelet Transform ",Proceedings of IE&EM'2003, 2003 International Conference of Industrial Engineering and Engineering Management: Global Industrial Engineering in e-century.
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